Patent · US Active

System and method for testing a circuit

US9188645B2 · kind B2 · utility

15Cited by

5References

9Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Jens Barrenscheen · Munich, DE
Dirk Hammerschmidt · Villach, AT

Key dates

Filing date	Dec 20, 2012
Grant date	Nov 17, 2015
Priority date	—
Expiry date	Jan 16, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/007
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an embodiment, a device comprises a circuit with at least one circuit element; measurement circuitry capable to test a state of the at least one circuit element during an operation of the circuit, the measurement circuitry comprising a first terminal configured to be coupled to a first node of the circuit via a first capacitor, a second terminal configured to be coupled to a second node of the circuit, wherein the measurement circuitry is configured to determine in situ an operating state of the at least one circuit element based on signals applied by the measurement circuitry to the circuit during the operation of the circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.