Ultrasonic measuring gauge
US9188672B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 13, 2012 |
| Grant date | Nov 17, 2015 |
| Priority date | — |
| Expiry date | Jul 18, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/6272
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ultrasonic measuring gauge includes a probe configured to be moved along a surface of a material to be measured, transmit ultrasonic waves to the material, and receive ultrasonic waves reflected from the material. The gauge also includes a processing unit and an input unit. The processing unit is configured to operate according to one of two different modes of operation based on an input received by the input unit. In a first mode of operation, the probe determines the thickness at portions between the first and second locations on the surface of the material at which the probe is coupled to the material regardless of whether the probe is continuously physically coupled between the two locations. In a second mode of operation, the processing unit determines a corresponding thickness of the material at each portion between two locations when the probe is continuously physically coupled between the two locations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.