Leon C. Vandervalk
19Patents
10h-index
9Co-inventors
65Inventor score
Filing activity: Oct 17, 1991 → Jan 25, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5325430A | Encryption apparatus for computer device | Physics | 81 | Expired |
| US5343146A | Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil | Physics | 77 | Expired |
| US6343510B1 | Ultrasonic testing using synthetic impulses | Physics | 45 | Expired |
| USRE35703E | Combination coating thickness gauge using a magnetic flux density sensor and an eddy current search coil | General | 44 | Expired |
| US5723791A | High resolution ultrasonic coating thickness gauge | Physics | 43 | Expired |
| US5686831A | Gauge with reversible display screen | Physics | 32 | Expired |
| US5930744A | Coating thickness gauge | Physics | 19 | Expired |
| US5777230A | Delay line for an ultrasonic probe and method of using same | Physics | 16 | Expired |
| US6282962A | High resolution ultrasonic thickness gauge | Physics | 11 | Expired |
| US5623427A | Nondestructive anodic capacity gauge | Physics | 10 | Expired |
| US6122968A | Delay line for an ultrasonic probe and method of using same | Physics | 10 | Expired |
| US6250160A | High resolution ultrasonic thickness gauge | Physics | 6 | Expired |
| US5751608A | Coating thickness gauge | General | 2 | Revoked |
| USRE41342E1 | Coating thickness gauge | General | 2 | Expired |
| US5979241A | Delay line for an ultrasonic probe and method of using same | Physics | 1 | Expired |
| US9188672B2 | Ultrasonic measuring gauge | Physics | 1 | Active |
| US9207174B2 | Apparatus and method for characterizing a replica tape | Physics | 0 | Active |
| US8994933B2 | Apparatus and method for characterizing a replica tape | Physics | 0 | Active |
| US10514328B2 | Method and system for testing surfaces for contaminants | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.