Apparatus for inspecting touch panel and method thereof
US9207273B2 · kind B2 · utility
1Cited by
1References
18Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 7, 2013 |
| Grant date | Dec 8, 2015 |
| Priority date | — |
| Expiry date | Feb 21, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0446
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.