Jun-Young Ko
45Patents
5h-index
62Co-inventors
72Inventor score
Filing activity: Mar 20, 1998 → Jan 9, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9720449B2 | Flexible display device including touch sensor | Emerging Cross-Sectional Technologies | 17 | Active |
| US6065381A | Apparatus for cutting tie bars of semiconductor packages | Emerging Cross-Sectional Technologies | 9 | Expired |
| US10671122B2 | Flexible display device including touch sensor | Emerging Cross-Sectional Technologies | 8 | Active |
| US7591714B2 | Wafer grinding and tape attaching apparatus and method | Performing Operations; Transporting | 6 | Expired |
| US7745932B2 | Semiconductor package, semiconductor package module including the semiconductor package, and methods of fabricating the same | Electricity | 6 | Active |
| US10008270B2 | Non-volatile memory device and programming method thereof | Physics | 5 | Active |
| US7576438B2 | Printed circuit board and method thereof and a solder ball land and method thereof | Electricity | 4 | Active |
| US8482133B2 | Semiconductor package | Electricity | 2 | Active |
| US9305899B2 | Method of fabricating semiconductor package | Electricity | 2 | Active |
| US7713788B2 | Method of manufacturing semiconductor package using redistribution substrate | Electricity | 2 | Active |
| US9748193B2 | Printed circuit board and semiconductor package using the same | Electricity | 2 | Active |
| US9430101B2 | Flat panel display with integrated touch screen panel | Physics | 1 | Active |
| US7420382B2 | Apparatus and method for testing semiconductor chip | Physics | 1 | Expired |
| US9207273B2 | Apparatus for inspecting touch panel and method thereof | Physics | 1 | Active |
| US8420450B2 | Method of molding semiconductor package | Electricity | 1 | Active |
| US8039972B2 | Printed circuit board and method thereof and a solder ball land and method thereof | Electricity | 1 | Active |
| US12183228B2 | Method and apparatus for inspecting display device | Physics | 0 | Active |
| US11460963B2 | Display device | Electricity | 0 | Active |
| US12142175B2 | Method and apparatus for inspecting display device | General | 0 | Revoked |
| US12039904B2 | Noise measuring device and noise measuring method using the same | Physics | 0 | Active |
| US9978458B2 | Memory device, memory system, and read/verify operation method of the memory device | Physics | 0 | Active |
| US7863161B2 | Method of cutting a wafer | Electricity | 0 | Active |
| US11893191B2 | Display device | Electricity | 0 | Active |
| US11769430B2 | Method and apparatus for inspecting display device | Physics | 0 | Active |
| US8956923B2 | Methods of fabricating semiconductor devices and underfill equipment for the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.