Test system for semiconductor array

US9218756B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Herbert Hopfgartner · Seeboden, AT
• Alexander Mayer · Velden am Wörther See, AT

Key dates

• Filing date: Jul 5, 2013
• Grant date: Dec 22, 2015
• Expiry date: Jun 13, 2034

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31924
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

In accordance with an embodiment, an integrated circuit includes a plurality of devices on the integrated circuit. Each device includes a driving circuit, an individual contact pad coupled to a first terminal of the driving circuit, and a switch having a first terminal coupled to the first terminal of the driving circuit. Also, the integrated circuit includes a shared contact pad coupled to a second terminal of each switch of the plurality of devices. The integrated circuit also includes a controller coupled to each switch of the plurality of devices, where the controller is configured to selectively control each switch to couple each driving circuit to the shared contact pad.