High-resolution microscope and method for determining the two- or three-dimensional positions of objects
US9234846B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 14, 2010 |
| Grant date | Jan 12, 2016 |
| Priority date | — |
| Expiry date | Jun 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a high-resolution microscope and to a method for determining the two- or three-dimensional positions of objects. The microscope and method includes the following: (a) The vertical (Z) position of imaged particles or molecules being determined from the orientation and shape thereof by means of an anamorphic lens, preferably a cylindrical lens, in the imaging, (b) the detection beam path being split into at least two partial detection beam paths having different optical path lengths, which are detected at an offset on a detector, (c) activation or switchover being performed by means of a multi-photon excitation process, preferably two-photon excitation. The following are also included: (d) a point-scanning activation or switchover, (e) a line-scanning activation or switchover, (f) the sample is excited and the sample light is detected in the wide-field mode, (g) manually or automatically predetermined sample regions are activated or switched over, (h) the activation or switchover is performed by means of AOTF or SLM or DMD, (i) laser pulses for activating or switching are spectrally split by means of a spectrally splitting element, preferably a grating, (j) a…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.