Patent · US Active

Method for producing thick film photoresist pattern

US9244354B2 · kind B2 · utility

1Cited by
1References
5Claims
0Family size

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Key dates

Filing dateDec 7, 2012
Grant dateJan 26, 2016
Priority date
Expiry dateDec 7, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/0048
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A method for producing a thick film photoresist pattern including laminating a thick photoresist layer including a chemically amplified positive-type photoresist composition for thick film on a support; irradiating the thick photoresist layer; and developing the thick photoresist layer to obtain a thick film resist pattern; in which the composition includes an acid generator, a resin whose alkali solubility increases by the action of an acid, and an organic solvent having a boiling point of at least 150° C. and a contact angle on a silicon substrate of no greater than 18°, in an amount of at least 40% by mass with respect to total mass of the organic solvent.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.