Semiconductor device with internal substrate contact and method of production
US9245843B2 · kind B2 · utility
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10Claims
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Assignee
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Key dates
| Filing date | Jan 16, 2013 |
| Grant date | Jan 26, 2016 |
| Priority date | — |
| Expiry date | Jan 16, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2224/02372
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The semiconductor device comprises a substrate (1) of semiconductor material, a contact hole (2) reaching from a surface (10) into the substrate, and a contact metallization (12) arranged in the contact hole, so that the contact metallization forms an internal substrate contact (4) on the semiconductor material at least in a bottom area (40) of the contact hole.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.