Patent · US Active

Plasma processing apparatus and plasma processing method

US9263313B2 · kind B2 · utility

1Cited by
2References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 2014
Grant dateFeb 16, 2016
Priority date
Expiry dateFeb 19, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32935
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A plasma processing apparatus is provided which includes a processing chamber disposed in a vacuum container, in a decompressed inside of which plasma is formed, a sample stage disposed in a lower part of the processing chamber, on a top surface of which a sample is mounted, a dielectric film made of a dielectric that forms a mounting surface on which the sample is mounted, and electrodes arranged inside the dielectric film and supplied with power for chucking and holding the sample onto the dielectric film, and when the sample is mounted on the sample stage, the sample is kept mounted on the sample stage until a sample temperature becomes a predetermined temperature or until a predetermined time elapses, and power is then supplied to the electrodes to chuck the sample to the sample stage and then start processing on the sample using the plasma.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.