Patent · US Active

Method and apparatus for testing a device-under-test

US9274175B2 · kind B2 · utility

2Cited by

2References

17Claims

0Family size

Assignee

ADVANTEST CORPORATION · JP

Inventors

Gil Golov · Backnang, DE
Thomas Henkel · Eppelheim, DE
Ronald D. Larson · Fort Collins, US
Ulrich Knoch · Eppelheim, DE

Key dates

Filing date	Jan 20, 2010
Grant date	Mar 1, 2016
Priority date	—
Expiry date	Feb 14, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31907
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for testing a device-under-test includes receiving, from at least one test channel circuit dedicated to communicate with an input/output pin of the device-under-test by means of at least one hardware resource, at least one logical control command describing a desired operation of the at least one hardware resource, and converting, by means of a resource controller, the at least one logical control command into at least one dedicated control command for the at least one hardware resource, wherein the at least one dedicated control command is adapted to be received by a physical implementation of the at least one hardware resource.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.