High-voltage transistor with high current load capacity and method for its production
US9276109B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 13, 2009 |
| Grant date | Mar 1, 2016 |
| Priority date | — |
| Expiry date | Jul 14, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/307
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An isolation area (10) is provided over a drift region (12) with a spacing (d) to a contact area (4) provided for a drain connection (D). The isolation area is used as an implantation mask, in order to produce a dopant profile of the drift region in which the dopant concentration increases toward the drain. The implantation of the dopant can be performed instead before the production of the isolation area, and the later production of the isolation area (10) changes the dopant profile also in a way that the dopant concentration increases toward the drain.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.