Test apparatus
US9279848B2 · kind B2 · utility
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5Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2014 |
| Grant date | Mar 8, 2016 |
| Priority date | — |
| Expiry date | Aug 22, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/0014
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a test apparatus including: test target sections each having a connector to connect a Device Under the Test (DUT); measuring sections that include measuring devices that have same measuring item respectively; a switch section that switches connection between the test target section and the measuring section under direction of a controller; wherein the controller selects one of the algorithms of connection, 1) searching vacancy of the measuring sections and directs the switch section to make a path between the test target section and the measuring section of vacancy, 2) holding the path that former selected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.