Isao Baba
18Patents
8h-index
23Co-inventors
72Inventor score
Filing activity: Sep 2, 1983 → Mar 23, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5172212A | Semiconductor having an improved electrode pad | Electricity | 38 | Expired |
| US4871796A | Method of production of thermoplastic elastomer compounds | Chemistry; Metallurgy | 23 | Expired |
| US5202612A | Concrete vibrator | Fixed Constructions | 17 | Expired |
| US4801651A | Method of manufacture of thermoplastic elastomer compounds | Chemistry; Metallurgy | 16 | Expired |
| US4873288A | Method for preparation of thermoplastic resin composition | Chemistry; Metallurgy | 12 | Expired |
| US4960823A | Resin composition for bumpers | Chemistry; Metallurgy | 11 | Expired |
| US4906683A | Thermoplastic elastomer composition | Chemistry; Metallurgy | 9 | Expired |
| US5153706A | Lead frames for use in plastic mold type semiconductor devices | Electricity | 9 | Expired |
| US5389817A | Semiconductor device having a flat jumper lead | Electricity | 8 | Expired |
| US6909184B2 | TAB type semiconductor device | Electricity | 7 | Expired |
| US5944540A | Operation assuring structure of electronic circuit board in connector for said circuit board | Electricity | 4 | Expired |
| US6822984B2 | Device for and method of testing semiconductor laser module | Electricity | 1 | Expired |
| US6807199B2 | Wavelength inspection method of a semiconductor laser diode and a wavelength inspection unit thereof | Electricity | 1 | Expired |
| US4872045A | Input protection device for C-MOS device | Electricity | 1 | Expired |
| US9279848B2 | Test apparatus | Electricity | 0 | Active |
| US8248587B2 | Testing method of semiconductor laser and laser testing device | Electricity | 0 | Active |
| US10379300B2 | Method for assembling optical module | Physics | 0 | Active |
| US7907650B2 | Laser module, control method of the same, control data of the same, and control data generation method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.