Patent · US Active

Semiconductor device comprising metal-based eFuses of enhanced programming efficiency by enhancing heat generation

US9287211B2 · kind B2 · utility

1Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 2011
Grant dateMar 15, 2016
Priority date
Expiry dateDec 26, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In sophisticated semiconductor devices, electronic fuses may be provided in the metallization system, wherein a superior two-dimensional configuration of the metal line, for instance as a helix-like configuration, may provide superior thermal conditions in a central line portion, which in turn may result in a more pronounced electromigration effect for a given programming current. Consequently, the size of the electronic fuse, at least in one lateral direction, and also the width of corresponding transistors connected to the electronic fuse, may be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.