Patent · US Active

System and method for image based inspection of an object

US9305345B2 · kind B2 · utility

26Cited by

7References

17Claims

0Family size

Assignee

General Electric Company · US

Inventors

Ser Nam Lim · Niskayuna, US
Jose Abiel Garza · Tempe, US
David Scott Diwinsky · West Chester, US
Li Guan · Jinan, CN
Shubao Liu · College Park, US
Xingwei Yang · Schenectady, US
Jens Rittscher · Ballston Lake, US

Key dates

Filing date	Apr 24, 2014
Grant date	Apr 5, 2016
Priority date	—
Expiry date	Jun 25, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG06T2219/012
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.