Xingwei Yang
4Patents
4h-index
13Co-inventors
43Inventor score
Filing activity: Dec 31, 2012 → Dec 27, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9305345B2 | System and method for image based inspection of an object | Physics | 26 | Active |
| US9251582B2 | Methods and systems for enhanced automated visual inspection of a physical asset | Physics | 17 | Active |
| US10203290B2 | Method for defect indication detection | Physics | 4 | Active |
| US10481108B2 | System for defect indication detection | Physics | 4 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.