Selecting parameters for defect detection methods
US9310316B2 · kind B2 · utility
11Cited by
7References
35Claims
0Family size
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Key dates
| Filing date | Sep 11, 2012 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Dec 12, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/9501
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for a defect detection method are provided. One method includes selecting one or more parameters of a defect detection method using an optimization function and information for a set of classified defects, which includes defects of interest and nuisance defects, such that the one or more parameters satisfy an objective for the defect detection method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.