Inventor · Davis, CA, US

Kenong Wu

33Patents
9h-index
88Co-inventors
78Inventor score

Filing activity: May 11, 2001 → Nov 30, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US6747646B2 System and method for fusing three-dimensional shape data on distorted images without correcting for distortion Human Necessities 97 Expired
US7729529B2 Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle Physics 27 Active
US7359544B2 Automatic supervised classifier setup tool for semiconductor defects Physics 24 Active
US7570800B2 Methods and systems for binning defects detected on a specimen Physics 23 Active
US8111900B2 Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle Physics 20 Active
US9092846B2 Detecting defects on a wafer using defect-specific and multi-channel information Physics 18 Active
US7142992B1 Flexible hybrid defect classification for semiconductor manufacturing Physics 16 Expired
US9310316B2 Selecting parameters for defect detection methods Physics 11 Active
US9601393B2 Selecting one or more parameters for inspection of a wafer Electricity 11 Active
US9518934B2 Wafer defect discovery Electricity 9 Active
US9189844B2 Detecting defects on a wafer using defect-specific information Physics 8 Active
US9171364B2 Wafer inspection using free-form care areas Physics 8 Active
US10365232B2 High accuracy of relative defect locations for repeater analysis Physics 6 Active
US10127652B2 Defect detection and classification based on attributes determined from a standard reference image Physics 5 Active
US9846930B2 Detecting defects on a wafer using defect-specific and multi-channel information Physics 4 Active
US9766186B2 Array mode repeater detection Physics 3 Active
US8989479B2 Region based virtual fourier filter Physics 3 Active
US10923317B2 Detecting defects in a logic region on a wafer Physics 2 Active
US9552636B2 Detecting defects on a wafer using defect-specific and multi-channel information Physics 2 Active
US9727047B2 Defect detection using structural information Electricity 2 Active
US9704234B2 Adaptive local threshold and color filtering Physics 2 Active
US10572991B2 System and method for aligning semiconductor device reference images and test images Physics 2 Active
US9766187B2 Repeater detection Physics 2 Active
US10679909B2 System, method and non-transitory computer readable medium for tuning sensitivies of, and determining a process window for, a modulated wafer Physics 0 Active
US9721337B2 Detecting defects on a wafer using defect-specific information Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.