Group III-V substrate material with particular crystallographic features and methods of making
US9312129B2 · kind B2 · utility
1Cited by
4References
20Claims
0Family size
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Key dates
| Filing date | Sep 4, 2013 |
| Grant date | Apr 12, 2016 |
| Priority date | — |
| Expiry date | Feb 1, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/0262
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method of forming a semiconductor substrate including providing a base substrate including a semiconductor material, and forming a first semiconductor layer overlying the base substrate having a Group 13-15 material via hydride vapor phase epitaxy (HVPE), the first semiconductor layer having an upper surface having a N-face orientation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.