Patent · US Active

Integrated circuit failure prediction using clock duty cycle recording and analysis

US9319030B2 · kind B2 · utility

0Cited by
11References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 12, 2013
Grant dateApr 19, 2016
Priority date
Expiry dateJun 27, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03K5/1565
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A system is disclosed, which may include a clock distribution circuit. The clock distribution circuit may include a duty cycle controller to distribute a clock output signal to a plurality of remote locations on a clock grid. The duty cycle controller may adjust, in response to a duty cycle control signal, a duty cycle of the clock output signal. The clock distribution circuit may also include a duty cycle measurement unit, to measure the duty cycle of the clock output signal at one of the remote locations, generate the duty cycle control signal, and generate and write duty cycle data values to a memory unit. The system may also include control logic to calculate and transmit a clock distribution circuit end-of-life date, by applying a model to stored duty cycle data values and to a duty cycle controller adjustment state.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.