Inventor · Eppelheim, DE

Thomas Gentner

17Patents
4h-index
24Co-inventors
60Inventor score

Filing activity: Jun 14, 1996 → Sep 29, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US5846583A Temperature sensing method and system for pasteurization Human Necessities 9 Expired
US10746790B1 Constrained pseudorandom test pattern for in-system logic built-in self-test Physics 5 Active
US9740813B1 Layout effect characterization for integrated circuits Physics 4 Active
US5704597A Radial bearing and trouble support having the radial bearing Mechanical Engineering; Lighting; Heating 4 Expired
US9354275B2 Testing an integrated circuit Physics 1 Active
US10281527B2 On-chip hardware-controlled window strobing Physics 0 Active
US11074147B2 Continuous mutual extended processor self-test Emerging Cross-Sectional Technologies 0 Active
US10684930B2 Functional testing of high-speed serial links Physics 0 Active
US9319030B2 Integrated circuit failure prediction using clock duty cycle recording and analysis Electricity 0 Active
US9904748B1 Layout effect characterization for integrated circuits Physics 0 Active
US10288684B2 On-chip hardware-controlled window strobing Physics 0 Active
US10114914B2 Layout effect characterization for integrated circuits Physics 0 Active
US11574695B1 Logic built-in self-test of an electronic circuit Physics 0 Active
US11239152B2 Integrated circuit with optical tunnel Physics 0 Active
US12292472B2 Testing a single chip in a wafer probing system Physics 0 Active
US10768232B2 ATE compatible high-efficient functional test Physics 0 Active
US11808808B2 Testing a single chip in a wafer probing system Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.