Patent · US Active

Processing methods and apparatus with temperature distribution control

US9324590B2 · kind B2 · utility

0Cited by
12References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 14, 2010
Grant dateApr 26, 2016
Priority date
Expiry dateAug 31, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/68792
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Wafer treatment process and apparatus is provided with a wafer carrier arranged to hold wafers and to inject a fill gas into gaps between the wafers and the wafer carrier. The apparatus is arranged to vary the composition, flow rate, or both of the fill gas so as to counteract undesired patterns of temperature non-uniformity of the wafers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.