Patent · US Active

System test apparatus

US9354996B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

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Key dates

Filing dateMar 15, 2011
Grant dateMay 31, 2016
Priority date
Expiry dateFeb 8, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3636
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.