Patent · US Active

Pressure measuring instrument and substrate processing apparatus provided with the pressure measuring instrument

US9360390B2 · kind B2 · utility

0Cited by
2References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 8, 2014
Grant dateJun 7, 2016
Priority date
Expiry dateMay 4, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L19/0636
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

There is provided a pressure measuring instrument including: a detecting unit including the reference pressure chamber therein and formed in a cylindrical shape, the diaphragm being disposed inside the detecting unit; a communicating unit for providing communication between the diaphragm and the measurement pressure chamber, and formed in a circular tube shape having an inner diameter smaller than an inner diameter of the detecting unit; and an annular flow-path forming unit disposed between the detecting unit and the communicating unit, and configured to form a substantially annular path. The communicating unit introduces a gas of the measurement pressure chamber into the substantially annular path. The annular flow-path forming unit allows the gas introduced from the communicating unit to pass through the substantially annular path and to supply the passing gas to a side surface of the diaphragm.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.