Patent · US Active

Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample

US9366694B2 · kind B2 · utility

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1References
10Claims
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Key dates

Filing dateJan 13, 2014
Grant dateJun 14, 2016
Priority date
Expiry dateJan 13, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01Q60/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A multimode local probe microscope having a resonator, a first electrode, and a second electrode, an excitation source adapted to generate mechanical resonance in the resonator, a metal tip fastened to the resonator, movement mechanism for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes. The metal tip is electrically connected to the output second electrode and the microscopy apparatus includes amplifier and filter for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and configured for regulating the distance Z between the end of the tip and the surface of the sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.