Patent · US Active

Chemical mechanical polishing of silicon carbide comprising surfaces

US9368367B2 · kind B2 · utility

2Cited by
5References
7Claims
0Family size

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Key dates

Filing dateApr 13, 2009
Grant dateJun 14, 2016
Priority date
Expiry dateSep 14, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/30625
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Slurry compositions and chemically activated CMP methods for polishing a substrate having a silicon carbide surface using such slurries. In such methods, the silicon carbide surface is contacted with a CMP slurry composition that comprises i) a liquid carrier and ii) a plurality of particles having at least a soft surface portion, wherein the soft surface portion includes a transition metal compound that provides a Mohs hardness <6, and optionally iii) an oxidizing agent. The oxidizing agent can include a transition metal. The slurry is moved relative to the silicon carbide comprising surface, wherein at least a portion of the silicon carbide surface is removed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.