High resolution microscope and image divider assembly

US9372333B2 · kind B2 · utility

Assignee

• Carl Zeiss Microscopy GmbH · DE

Inventors

• Thomas Kalkbrenner · Jena, DE
• Michael Goelles · Jena, DE

Key dates

• Filing date: Dec 14, 2010
• Grant date: Jun 21, 2016
• Expiry date: May 1, 2033

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/245
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a microscope having an illumination beam path with wide field illumination of a sample and a first detection beam path having a spatially resolved surface receiver, which is reached by a first part of the detection light coming from the sample via the first detection beam path, or an image divider assembly for a microscope. In order to lengthen the optical path length, at least a second part of the detection light coming from the sample is masked out of the detection beam path and, via deflection means belonging to the detection beam path, is led into a second detection beam path and, preferably via further deflection means, is deflected back in the direction of the detection in such a way that detection light is applied to at least two partial regions beside one another on the surface receiver. At least the second part of the detection light runs in an optical element having an optical density that is increased as compared with the first detection beam path, in order to lengthen the optical path length, and the optical element is designed to be displaceable at an angle, preferably perpendicular, to the optical axis of the first detection beam path in order…