System and method for automatic quality control for assembly line processes
US9390491B2 · kind B2 · utility
1Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2013 |
| Grant date | Jul 12, 2016 |
| Priority date | — |
| Expiry date | Mar 19, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N7/18
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system and method is disclosed for a quality control and/or inspection procedure for assembly line processes. The disclosed system and method enable automatic optical inspection of a device during different stages of manufacture as well as in its finished form. The disclosed system and method enable the automatic quality control process to be self-learning, dynamic, and to identify and classify defects in real time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.