Inventor · Taipei, TW

Kewei Zuo

20Patents
4h-index
32Co-inventors
59Inventor score

Filing activity: Jun 27, 2007 → Mar 14, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7974728B2 System for extraction of key process parameters from fault detection classification to enable wafer prediction Physics 49 Active
US8682466B2 Automatic virtual metrology for semiconductor wafer result prediction Physics 8 Active
US9010617B2 Solder joint reflow process for reducing packaging failure rate Electricity 5 Active
US8433434B2 Near non-adaptive virtual metrology and chamber control Physics 4 Active
US8945983B2 System and method to improve package and 3DIC yield in underfill process Electricity 3 Active
US10964566B2 Machine learning on overlay virtual metrology Physics 2 Active
US7972969B2 Method and apparatus for thinning a substrate Electricity 2 Active
US11626304B2 Machine learning on overlay management Physics 1 Active
US9390491B2 System and method for automatic quality control for assembly line processes Electricity 1 Active
US9037279B2 Clustering for prediction models in process control and for optimal dispatching Physics 1 Active
US9390060B2 Packaging methods, material dispensing methods and apparatuses, and automated measurement systems Electricity 1 Active
US9508653B2 Die-tracing in integrated circuit manufacturing and packaging Electricity 1 Active
US8905124B2 Temperature controlled loadlock chamber Electricity 0 Active
US12237188B2 Machine learning on overlay management Physics 0 Active
US9177843B2 Preventing contamination in integrated circuit manufacturing lines Emerging Cross-Sectional Technologies 0 Active
US9698030B2 Temperature controlled loadlock chamber Electricity 0 Active
US10054938B2 Clustering for prediction models in process control and for optimal dispatching Physics 0 Active
US12197138B2 Machine learning on overlay management Physics 0 Active
US9153506B2 System and method for through silicon via yield Electricity 0 Active
US9588505B2 Near non-adaptive virtual metrology and chamber control Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.