Patent · US Active

Electrostatic discharge protection

US9391060B2 · kind B2 · utility

3Cited by
4References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 23, 2014
Grant dateJul 12, 2016
Priority date
Expiry dateDec 23, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/62

Abstract

An electrostatic discharge (ESD) protection device implemented in finFET technology is disclosed. The device has a reduced thickness shallow trench isolation (STI) layer which allows migration of high-doped drain implants therethrough to form regions extending under the STI layer thereby creating a planar-like region under the STI layer. Further, the regions are formed in an n-well layer provided between a substrate and the STI layer. The formation of the planar-like region under the STI layer has the advantage that part of the thermal energy produced in the device during an ESD event is generated under the STI layer where it can be more efficiently dissipated towards a substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.