Patent · US Active

System and method for gradient thermal analysis by induced stimulus

US9411002B2 · kind B2 · utility

1Cited by
3References
13Claims
0Family size

Inventor

Key dates

Filing dateJun 20, 2014
Grant dateAug 9, 2016
Priority date—
Expiry dateJun 25, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/287
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A thermal gradient is induced in a device-under-test (DUT) and used to determine the location of a defect. In one embodiment, a static thermal gradient is induced across at least a portion of the DUT along a first axis. The thermal gradient is incrementally walked along the first axis until the condition associated with the defect is triggered, thereby defining a first region. The thermal gradient is then induced along a second axis of the DUT and the process is repeated to define a second region. The location of the defect is determined to be the intersection of the first region with the second region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.