James B. Colvin
16Patents
8h-index
3Co-inventors
61Inventor score
Filing activity: Nov 8, 1995 → Jun 20, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5892539A | Portable emission microscope workstation for failure analysis | Physics | 128 | Expired |
| US5970167A | Integrated circuit failure analysis using color voltage contrast | Physics | 41 | Expired |
| US5764409A | Elimination of vibration by vibration coupling in microscopy applications | Physics | 38 | Expired |
| US6608291B1 | Induction heating apparatus | Electricity | 26 | Expired |
| US6134365A | Coherent illumination system and method | Emerging Cross-Sectional Technologies | 11 | Expired |
| US7872485B2 | System and method for use in functional failure analysis by induced stimulus | Physics | 10 | Active |
| US6245586A | Wire-to-wire bonding system and method | Electricity | 9 | Expired |
| US6112004A | Emission microscopy system and method | Emerging Cross-Sectional Technologies | 8 | Expired |
| US7323888B1 | System and method for use in functional failure analysis by induced stimulus | Physics | 6 | Expired |
| US6040930A | Volume holographic storage using rotated signal beam encoder | Physics | 6 | Expired |
| US9465049B2 | Apparatus and method for electronic sample preparation | Emerging Cross-Sectional Technologies | 3 | Active |
| US8797052B2 | System and method for gradient thermal analysis by induced stimulus | Physics | 2 | Active |
| US9411002B2 | System and method for gradient thermal analysis by induced stimulus | Physics | 1 | Active |
| US9157935B2 | Apparatus and method for endpoint detection during electronic sample preparation | Emerging Cross-Sectional Technologies | 0 | Active |
| US8400175B2 | System and method for use in functional failure analysis by induced stimulus | Physics | 0 | Active |
| US9034667B2 | Apparatus and method for endpoint detection during electronic sample preparation | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.