Patent · US Active

Microscope and a method for examining a sample using a microscope

US9411141B2 · kind B2 · utility

0Cited by

2References

19Claims

0Family size

Assignee

LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

Frank Schreiber · Dossenheim, DE
Lioba Kuschel · Mannheim, DE
Patric Mrawek · Haßloch, DE
Bernd Widzgowski · Dossenheim, DE

Key dates

Filing date	Sep 27, 2013
Grant date	Aug 9, 2016
Priority date	—
Expiry date	Sep 27, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0612
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A microscope, in particular a confocal microscope, has one or more lasers for generating an illumination light for a sample and has a detection device for detected signals from the sample. The detection device includes multiple adjustable spectral detection channels for the detection of predefinable different wavelength regions, and is configured and refined in the interest of particularly versatile utilization in consideration of a wide variety of phenomena, with particularly good separation of the phenomena in the context of investigation, in such a way that multiple temporal detection windows are respectively settable for the spectral detection channels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.