Patent · US Active

Methods and apparatus for depositing and/or etching material on a substrate

US9412566B2 · kind B2 · utility

4Cited by
9References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 27, 2013
Grant dateAug 9, 2016
Priority date
Expiry dateFeb 27, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L22/12
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Methods are disclosed for depositing material onto and/or etching material from a substrate in a surface processing tool having a processing chamber, a controller and one or more devices for adjusting the process parameters within the chamber. The method comprises: the controller instructing the one or more devices according to a series of control steps, each control step specifying a defined set of process parameters that the one or more devices are instructed to implement, wherein at least one of the control steps comprises the controller instructing the one or more devices to implement a defined set of constant process parameters for the duration of the step, including at least a chamber pressure and gas flow rate through the chamber, which duration is less than the corresponding gas residence time (Tgr) of the processing chamber for the step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.