Method for image outlier removal for transmission electron microscope cameras
US9415095B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 30, 2015 |
| Grant date | Aug 16, 2016 |
| Priority date | — |
| Expiry date | Jul 30, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2617
- WIPO fieldPharmaceuticals
- WIPO sectorChemistry
Abstract
Methods are disclosed for removal of outlier pixels from a transmission electron microscopy camera image. One exemplary method includes establishing a desired exposure of n electrons per pixel; exposing the camera to a series of sub-frame exposures to produce a series of sub-frame images; calculating an average image signal of all sub-frame exposures in said series; establishing a threshold selected to achieve a desired number of false positives; evaluating each of said sub-frame exposures for pixels further away from said average than said threshold; and replacing pixels in each of said sub-frame images that exceed said threshold with said average to form corrected sub-frame images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.