Patent · US Active

Error correction in memory devices by multiple readings with different references

US9430328B2 · kind B2 · utility

7Cited by
0References
15Claims
0Family size

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Key dates

Filing dateJan 15, 2015
Grant dateAug 30, 2016
Priority date
Expiry dateApr 14, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2013/0054
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory device may include memory cells. The method may include receiving a request of reading a selected data word associated with a selected code word stored with an error correction code, and reading a first code word representing a first version of the selected code word by comparing a state of each selected memory cell with a first reference. The method may include verifying the first code word, setting the selected code word according to the first code word in response to a positive verification, reading at least one second code word representing a second version of the selected code word, verifying the second code word, and setting the selected code word according to the second code word in response to a negative verification of the first code word and to a positive verification of the second code word.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.