Patent · US Active

Integrated circuit device and method therefor

US9435862B2 · kind B2 · utility

0Cited by

11References

13Claims

0Family size

Assignee

Freeescale Semiconductor, Inc. · US

Inventors

Vladimir Litovchenko · Ebersberg, DE
Heiko Ahrens · Munich, DE
Andreas Stahl · Cologne, DE

Key dates

Filing date	Jul 14, 2014
Grant date	Sep 6, 2016
Priority date	—
Expiry date	Jan 7, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31727
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An integrated circuit device comprising at least one self-test component arranged to execute self-testing within at least one self-test structure during a self-test execution phase of the IC device, and at least one clock control component arranged to provide at least one clock signal to the at least one self-test component at least during the self-test execution phase of the IC device. The at least one clock control component is further arranged to receive at least one indication of at least one power dissipation parameter for at least a part of the IC device, and modulate the at least one clock signal provided to the at least one self-test component based at least partly on the received at least one power dissipation parameter for at least a part of the IC device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.