Storage module and method for improved error correction by detection of grown bad bit lines
US9436549B2 · kind B2 · utility
3Cited by
11References
20Claims
0Family size
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Key dates
| Filing date | Sep 30, 2014 |
| Grant date | Sep 6, 2016 |
| Priority date | — |
| Expiry date | Dec 23, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a storage module comprises a controller and a memory having a plurality of bit lines. The controller detects an uncorrectable error in a code word read from the memory, determines location(s) of grown bad bit line(s) that contributed to the error in the code word being uncorrectable, and uses the determined location(s) of the grown bad bit line(s) to attempt to correct the error in the code word.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.