Methods and apparatus for image analysis using threshold compactness features
US9443129B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 21, 2014 |
| Grant date | Sep 13, 2016 |
| Priority date | — |
| Expiry date | Jun 21, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A new family of morphological features, referred to herein as threshold compactness features, is provided, useful for automated classification of objects, such as cells, in images. In one embodiment, one or more thresholds and/or binary masks are applied to an image, and one or more provisional objects within a cell in the image are automatically identified. The threshold compactness of the cell is computed as a function of area S of the one or more provisional objects and border length P of the one or more provisional objects. Computation of threshold compactness allows cells in an image to be distinguished and characterized. Compared to previous techniques, the methods and apparatus described herein are more robust and computationally efficient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.