Patent · US Active

X-ray illuminators with high flux and high flux density

US9449781B2 · kind B2 · utility

39Cited by
136References
43Claims
0Family size

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Key dates

Filing dateDec 8, 2014
Grant dateSep 20, 2016
Priority date
Expiry dateDec 8, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2235/086
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This disclosure presents systems for x-ray illumination that have an x-ray brightness several orders of magnitude greater than existing x-ray technologies. These may therefore useful for applications such as trace element detection or for micro-focus fluorescence analysis. The higher brightness is achieved in part by using designs for x-ray targets that comprise a number of microstructures of one or more selected x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment of the targets with higher electron density or higher energy electrons, which leads to greater x-ray flux. The high brightness/high flux x-ray source may then be coupled to an x-ray optical system, which can collect and focus the high flux x-rays to spots that can be as small as one micron, leading to high flux density.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.