Method and apparatus for examining a sample
US9476766B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 30, 2012 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Nov 6, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0084
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and an apparatus for examining a sample. The apparatus has a light source for generating excitation light in pulses which occur in succession at an excitation pulse frequency, for illuminating a sample region with the excitation pulse, and having a detector for detecting the detection light emanating from the sample region. The apparatus is characterized in that, for each detected photon of the detection light, the detector generates an electrical pulse and thereby a sequence of electrical pulses, and an analog-digital converter is provided that generates a digital data sequence by sampling the sequence of electrical pulses at a sampling rate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.