System and method for measuring data retention in a non-volatile memory
US9478303B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 29, 2015 |
| Grant date | Oct 25, 2016 |
| Priority date | — |
| Expiry date | Apr 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C7/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile memory system may include a mechanism for analyzing and measuring/predicting data loss without reading data in memory cells of the non-volatile memory. The system may include a data management module that utilizes charge loss measurements of a reference charge device that is independent of the memory cells that are configured to store data. The measured charge loss may be correlated with a predetermined data loss profile for the non-volatile memory that corresponds with charge loss on the reference charge device. The method may include charging the reference charge device when the non-volatile memory system is being powered down and making the charge loss measurement, and estimating data loss, when the non-volatile memory system is later powered up. The non-volatile memory cells may be refreshed when the estimated data loss is above a predetermined threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.