Patent · US Active

Dicing in wafer level package

US9484227B1 · kind B1 · utility

12Cited by
11References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 22, 2015
Grant dateNov 1, 2016
Priority date
Expiry dateJun 22, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/1815
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method includes placing a first device die and a second device die over a carrier, with a scribe line between the first device die and the second device die. The first device die and the second device die are encapsulated with an encapsulating material, which has a portion in the scribe line. The method further includes forming a dielectric layer over the encapsulating material, performing a first die-saw to form a first trench in the scribe line, performing a second die-saw to form a second trench in the scribe line, and performing a third die-saw on the scribe line to separate the first device die from the second device die.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.