Automatic microscopic focus system and method for analysis of transparent or low contrast specimens
US9488819B2 · kind B2 · utility
9Cited by
5References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 31, 2012 |
| Grant date | Nov 8, 2016 |
| Priority date | — |
| Expiry date | Apr 1, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/244
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A microscope system and method empirically determines the boundaries of the depth of field of an objective lens. The system and method are largely automated, with the manipulation of a specimen to be imaged being carried out by processors and associated equipment. Calculations of the empirical depth of field are also likewise automated. Upon empirically determining the boundaries of the depth of field, the specimen, particularly when transparent or translucent, can be accurately imaged at user-defined depths smaller than the depth of field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.