Patent · US Active

Micromechanical measuring element and method for producing a micromechanical measuring element

US9506831B2 · kind B2 · utility

0Cited by
16References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2013
Grant dateNov 29, 2016
Priority date
Expiry dateMay 21, 2033

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/15151
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A micromechanical measuring element includes a carrier and a sensitive element connected to the carrier by a first solder connection and a second solder connection. The sensitive element is contacted electrically by the first solder connection. The sensitive element, the carrier and the second solder connection form a first chamber. The first chamber has a first opening.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.