Patent · US Active

Method of manufacturing semiconductor device

US9508546B2 · kind B2 · utility

3Cited by
0References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2014
Grant dateNov 29, 2016
Priority date
Expiry dateJun 10, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32577
  • WIPO fieldSurface technology, coating
  • WIPO sectorChemistry

Abstract

A method of manufacturing a semiconductor device is disclosed. The method includes (a) loading a substrate into a process chamber; (b) processing the substrate by supplying a process gas into the process chamber via a shower head disposed above the process chamber and including a buffer chamber; (c) unloading the substrate from the process chamber; and (d) cleaning the buffer chamber and the process chamber after performing the step (c), wherein the step (d) comprises: (d-1) cleaning the buffer chamber by a plasma generation from a cleaning gas in the buffer chamber by a plasma generation unit including a plasma generation region switching unit; and (d-2) cleaning the process chamber by switching the plasma generation from the cleaning gas in the buffer chamber to a plasma generation from the cleaning gas in the process chamber by the plasma generation region switching unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.