Patent · US Active

Replacement metal gate

US9515070B2 · kind B2 · utility

4Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 2, 2015
Grant dateDec 6, 2016
Priority date
Expiry dateDec 2, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/691

Abstract

A semiconductor structure which includes: a fin on a semiconductor substrate; and a gate structure wrapped around the fin. The gate structure includes: spaced apart spacers to form an opening, the spacers being perpendicular to the fin, the spacers having a height with respect to the fin; a high-k dielectric material in the opening and over the fin, the high-k dielectric material in contact with the spacers and a bottom of the opening; a work function metal in contact with the high-k dielectric material that is over the fin, the spacers and the bottom of the opening, the work function metal that is in contact with the high-k dielectric material having a height in the opening that is less than the height of the spacers, the high-k dielectric material and the work function metal only partially filling the opening; and a metal completely filling the opening.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.