Persistent command parameter table for pre-silicon device testing
US9524801B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 17, 2016 |
| Grant date | Dec 20, 2016 |
| Priority date | — |
| Expiry date | Mar 17, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/54
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.