Patent · US Active

X-ray sources using linear accumulation

US9543109B2 · kind B2 · utility

32Cited by
2References
20Claims
0Family size

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Key dates

Filing dateApr 1, 2016
Grant dateJan 10, 2017
Priority date
Expiry dateApr 1, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2235/1291
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. The orientation of the microstructures allows the use of an on-axis collection angle, allowing the accumulation of x-rays from several microstructures to be aligned to appear to have a single origin, also known as “zero-angle” x-ray radiation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.